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Attributs	Valeurs
type	work Issue
Is Part Of	http://hub.abes.fr/springer/periodical/11082/1996/volume_28
Date Issued	1996-07-01(xsd:dateTime)
has manifestation of work	http://hub.abes.fr/springer/periodical/11082/1996/volume_28/issue_7/m/print http://hub.abes.fr/springer/periodical/11082/1996/volume_28/issue_7/m/web
Date Copyrighted	1996
issue	7
Rights Holder	Chapman & Hall
is Is Part Of of	Electrooptic characterization of modulation-doped field-effect transistors with monolithically-integrated test fixtures Monolithically-integrated optoelectronic circuit for ultrafast sampling of a dual-gate field-effect transistor Ultrafast characterization of in-plane-gate field-effect transistors: parasitics in laterally gated transistors Modulation bandwidth and noise limit of photoconductive gates Widely tunable electrooptic pulse-pattern generation and its application to on-wafer large-signal characterization of ultra high-speed electronic devices Ultrafast-ultrafine probing of high-speed electrical waveforms using a scanning force microscope with photoconductive gating Separating temporally-overlapped waveforms with electrooptic sampling Optical probing of ultrafast devices and integrated circuits A new method for characterizing ultrafast resonant-tunnelling diodes with electrooptic sampling Analysis of microwave propagation effects using two-dimensional electrooptic field mapping techniques Ultrafast electrical signal generation, propagation and detection Precise analysis of linear and non-linear chirp parameters of gain-switched distributed feedback laser pulses for the fibre optic compression scheme Optoelectronic techniques for ultrafast device network analysis to 700 GHz A proposed semiconductor laser pump-probe source Two-dimensional field mapping of monolithic microwave integrated circuits using electrooptic sampling techniques Electrooptic sampling of low temperature GaAs pulse generators for oscilloscope calibration Electrooptic sampling of freely propagating terahertz fields Scanning probe microscopy for testing ultrafast electronic devices Full wave electromagnetic simulation of electrooptic high-speed probes

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